DFT Director_Bengaluru

Hi All, Greetings from Eximietas Design! We're Hiring | Senior DFT Professionals | Eximietas Design Locations: India: Bengaluru, Hyderabad, Ahmedabad & Visakhapatnam. San Jose (Bay Area), USA Eligibility (USA): U.S. Permanent Residents (Green Card holders). Experience: 20 Years. Job Description: We are seeking motivated Design for Test (DFT) professionals to join our growing team. You will be responsible for the end-to-end DFT flow, from RTL to final pattern delivery, across complex IP, Subsystem, and SoC designs. Key Skills: ✔ End-to-End DFT Flow Ownership. ✔ Scan Insertion, EDT & OCC. ✔ ATPG, DRC Analysis & Coverage Closure. ✔ Pattern Simulation & Debugging. ✔ SoC Integration & Pattern Retargeting. ✔ MBIST, IJTAG & JTAG Implementation. ✔ DFT Sign-off Activities. Tools Expertise: Siemens Tessent. Synopsys TestMAX / TetraMAX. Cadence Modus. Preferred Skills: ✅ Streaming Scan Network (SSN). ✅ Analog & Mixed-Signal DFT. ✅ SpyGlass DFT. ✅ RTL DFT Methodologies. ✅ TCL, Python & Perl Scripting. Core Responsibilities: • End-to-end ownership of DFT implementation flow from RTL to sign-off. • Scan architecture implementation including EDT & OCC. • ATPG, DRC analysis, coverage optimization, and pattern simulations. • SoC integration, pattern retargeting, and DFT debugging. • MBIST, IJTAG, and Boundary Scan (JTAG) integration. • Collaboration with Design, Verification, and Physical Design teams. • DFT sign-off ownership and deliverables. Technical Requirements: • Strong experience in ATPG simulations and netlist handling. • Expertise in block-level and SoC-level pattern retargeting/debugging. • Strong understanding of ICL and PDL standards. • Hands-on experience with Tessent, TestMAX/TetraMAX, or Modus. Interested candidates can share their updated resume at: Contact: Referrals are highly appreciated. Please share within your network. Best Regards, Maruthy Prasaad Associate VLSI Manager – Talent Acquisition | Visakhapatnam Eximietas Design ( Excellence by Design) Inspired by nature, driven by silicon.